CHANG Peng, WANG Pu, GAO Xuejin. Fault monitoring batch process based on statistics pattern analysis of T-KPLS[J]. CIESC Journal, 2015, (1): 265-271.DOI: 10.11949/j.issn.0438-1157.20141476.
Total kernel projection to latent structures (T-KPLS) has been widely used in the fault detection control field
its core idea is to conduct the covariance matrix decomposition of the data matrix
without using the higher-order statistics and other useful information of the data
which will cause an information loss in the feature extraction process
then result in a bad fault recognition performance. Aiming to solve the problem
a statistics pattern analysis (SPA) combing with the T-KPLS based multi-way statistics pattern analysis total kernel projection to latent structures (MSPAT-KPLS) is proposed. First
different order statistics of the data samples are constructed to map the data from the original data space into the statistic sample space
then utilize kernel function to map the statistic sample space into the higher dimensional kernel space
and according to the quality variable
the feature space will be divided into 4 subspaces
namely: process variable related to quality variable space
process variable not related to quality variable space
process variable orthogonal to quality variable space and residual error space; Lastly
aiming at the process variable related to quality variable subspace and the residual error space
different detection models are constructed
which will trace the fault variables when faults are detected. In the end
apply the proposed method on the microbial fermentation process
and the comparison results with the traditional methods show that the proposed method could achieve a better detection.